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Next Inspection Solutions for Semiconductor

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Laser-based Patterned Wafer
Defect Inspection Tool

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IRIS

Defect Inspection solution for
3D device processes

TWINS

Integrated inspection
system module

Corporate News

  • 2018-03-07

    Jan. 31, 2018 SEMICON KOREA exhibition


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  • 2018-03-07

    Dec. 13, 2017 SEMICON JAPAN exhibition


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  • 2017-10-25

    Oct. 17, 2017 SEDEX 2017 exhibition


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  • 2017-04-02

    Apr. 25, 2017 SEMICON Southeast Asia exhibition


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  • 2017-02-20

    Mar. 14, 2017 SEMICON China exhibition


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  • 2017-01-16

    Feb. 08, 2017 SEMICON Korea exhibition


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  • 2016-12-14

    Dec. 14, 2016 SEMICON JAPAN exhibition


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  • 2016-10-26

    2016 October 26, 2016 Semiconductor SEDEX 2016 Conference


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  • 2016-09-07

    9 September 2016 – Sept. 9, 2016 at the Taiwan Exposition


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  • 2016-08-30

    Obtaining AEGIS equipment performance certificates in the German Institute of Technology (Fraunhofer IPMS)


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  • 2016-08-26

    Performance evaluation project selection


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  • 2016-08-24

    Obtaining performance of AEGIS equipment for semiconductor equipment


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  • 2016-01-27

    January 27, 2016 SEMICON Korea Exhibition


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  • 2015-02-06

    February 2, 2015 SEMICON Korea Exhibition


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  • 2014-10-06

    Deliver Equipment to Fraunhofer IPMS-CNT in Germany


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  • 2014-08-12

    IR52 Received Jang Young Sil Award


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Product

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Press Release

[IR52 Chang Young Sil Award] Nextin / Wa...
STI-NEXTIN released a hybrid equipment f...
Nextin carried out the first commerciali...
Nextin came into the semi-conductor test...
The AP system invested money in Nextin. ...
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